Influence of Temperature on Microelectronics and System Reliability-A Physics of Failure Approach
Pradeep Lall (Author), Michael G. Pecht (Author), Edward B. Hakim (Author)Categories:
Year:
1997
Edition:
1
Publisher:
CRC Press
Language:
english
ISBN 10:
0429600070
ISBN 13:
9780849394508
File:
PDF, 101.95 MB
IPFS:
,
english, 1997